Scanning Electron Microscopy and X-ray Microanalysis, 10.0 credits

Svepelektronmikroskopi och röntgenmikroanalys, 10.0 hp

6FIEI45

Course level

Third-cycle Education

Description

The course aims to give the doctoral student a broad knowledge and systematic understanding of scanning electron microscopy (SEM) and X-ray microanalysis as well as hands-on experience within this. The course consists of lectures, laboratory exercises and project work. The course's content consists of reading the course literature, prepare and give some lectures based on the literature including discussing content and results of the student's learning related to the course's objectives.

Not open for registration.

Contact

Grading

Two-grade scale